Work

Characterization and quality control of semiconductor wafers using time-correlated single photon counting

Year: 2012

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.929814

Authors: V. Buschmann, S. Fore, F. Koberling, A. Knigge, P. Kapusta, U. Ortmann, M. Roczen, R. Erdmann

Institutions: PicoQuant (Germany), Ferdinand-Braun-Institut, Helmholtz-Zentrum Berlin für Materialien und Energie

Language: English

Topic: Advanced Fluorescence Microscopy Techniques

Subfield: Biophysics

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2005151041

FWCI: 0.867

Cites:

Cited by: 1

Related to: 10