Electrical and Structural Properties of Mixed Chromium and Silicon Monoxide Films
Year: 1968
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1656951
Authors: Alvin A. Milgram, Chih-Shun Lu
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Funder: Syracuse University
OpenAlex ID: W2005245794
