Year: 1994
Type: article
Abstract: The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir–Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit.
Source: Journal of Applied Physics
DOI: 10.1063/1.356428
Institution: University of Twente
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2005292659