Work

Intermittent Hardware Errors Recovery: Modeling and Evaluation

Year: 2012

Type: conference-paper

Source: International Conference on Quantitative Evaluation of Systems (QEST)

DOI: 10.1109/qest.2012.37

Authors: Layali Rashid, Karthik Pattabiraman, Sathish Gopalakrishnan

Institution: University of British Columbia

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Council, National Research Council Canada

OpenAlex ID: W2005386786

FWCI: 3.678

Cites: 36

Cited by: 20

Related to: 10