RF and microwave characteristics of a 20nm gate length InAlN/GaN-based HEMT having a high “Figure of Merit”
Year: 2014
Type: conference-paper
Authors: A. Bhattacharjee, T. R. Lenka
Institution: National Institute Of Technology Silchar
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2005444358
