A process-dependent worst-case analysis for MMIC design based on a handy MESFET simulator
Year: 1989
Type: article
DOI: 10.1109/22.32229
Authors: J.-L. Cazaux, M. Pouysegur, D. Roques, S. Bertrand
Institution: Alcatel-Lucent (France)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2005665125