Year: 1992
Type: article
Abstract: It is demonstrated that due to inevitable intrinsic imperfections in the microfabrication process of atomic force microscopy (AFM) tips, images of rough surfaces can be totally dominated by tip artifacts. These images reflect the mesoscopic tip shape as concluded from a comparison of AFM and scanning electron microscopy images of the tip and sample. These tip artifacts have been found on a scale of 20–600 nm, showing the necessity of characterizing the tip shape in order to make reliable sample-specific statements.
Source: Applied Physics Letters
DOI: 10.1063/1.106862
Authors: P. Grütter, W. Zimmermann-Edling, D. Brodbeck
Institution: University of Basel
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2005693038