IN SITU MEASUREMENTS OF STRESS WITH TEMPERATURE IN THIN FILM PbxBa1 − xTiO3
Year: 2006
Type: article
Source: Integrated ferroelectrics
Authors: D. A. BOYD, M. Y. EL-NAGGAR, D. G. GOODWIN
Institution: California Institute of Technology
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2006700540