Structure of GaAs-In0.2Ga0.8As heterojunction interface studied by electron spectroscopies: X-ray photoelectron spectroscopy, tunable electron energy loss spectroscopy and Auger electron spectroscopy
Year: 1987
Type: article
Source: Thin Solid Films
Authors: M. Iwami, Y. Watanabe, H. Kato, M. Nakayama, N. Sano
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2007157799
