Year: 2002
Type: article
Abstract: The electrochemical dissolution of silicon in fluoride media under very high potentials (5-100 V) was investigated. The interface was characterized by voltammetry and in situ infrared spectroscopy. The infrared results indicate that the interfacial oxide becomes porous above a critical potential of ∼20 V. Light emission from the interface was observed for potentials above ∼10 V. The electroluminescence signal was found to be composed of a red component and a blue component. Both components exhibit an increase in intensity as a function of applied potential, but their distinct dependence suggests that they arise from two distinct types of oxide defects and excitation mechanisms. © 2002 The Electrochemical Society. All rights reserved.
DOI: 10.1149/1.1463403
Authors: M. Lharch, M. Aggour, J.-N. Chazalviel, F. Ozanam
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2007193391
