Work

Electron tunneling and contact resistance of metal-silicon contact barriers

Year: 1970

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(70)90056-0

Author: A.Y.C. Yu

Institution: Fairchild Semiconductor (United States)

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007193978

FWCI: 4.133

Cites: 21

Cited by: 548

Related to: 10