Work

Reliability study of 1060nm 25Gbps VCSEL in terms of high speed modulation

Year: 2012

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.907536

Authors: Toshihito Suzuki, Suguru Imai, Shinichi Kamiya, Koji Hiraiwa, Masaki Funabashi, Yasumasa Kawakita, Hitoshi Shimizu, Takuya Ishikawa, Akihiko Kasukawa

Institution: Furukawa Electric (Japan)

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007364481

FWCI: 2.844

Cites:

Cited by: 13

Related to: 10