Work

Phosphorus doping of Si nanocrystals embedded in silicon oxynitride determined by atom probe tomography

Year: 2014

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.4862174

Authors: Hubert Gnaser, Sebastian Gutsch, Michael Wahl, Rüdiger Schiller, Michael Kopnarski, Daniel Hiller, Margit Zacharias

Institutions: University of Kaiserslautern, Institut für Oberflächen- und Schichtanalytik GmbH, University of Freiburg

Language: English

Topic: Silicon Nanostructures and Photoluminescence

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Deutsche Forschungsgemeinschaft

Award: G3903734699

OpenAlex ID: W2007508126

FWCI: 4.85

Cites: 45

Cited by: 65

Related to: 10