Work

A novel method for evaluating electron/hole mismatch in scaled split-gate SONOS memories

Year: 2008

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.2008.4796691

Authors: Yukihide Tsuji, Masayuki Terai, Shinji Fujieda, Toshiyuki Syo, Tomoya Saito, Koich Ando

Institution: NEC (Japan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2007697440

FWCI: 0.474

Cites: 7

Cited by: 4

Related to: 10