Work

Analysis of CZT crystals and detectors grown in russia and the ukraine by high-pressure bridgman methods

Year: 1999

Type: article

Source: Journal of Electronic Materials

DOI: 10.1007/s11664-999-0055-5

Authors: H. Hermon, M. Schieber, R. B. James, E. Y. Lee, N. Yang, A. J. Antolak, D. H. Morse, C. Hackett, E. Tarver, N. N. P. Kolesnikov, Yu N. Ivanov, V. Komar, M. S. Goorsky, H. Yoon

Institutions: Sandia National Laboratories California, Hebrew University of Jerusalem, Russian Academy of Sciences, Osipyan Institute of Solid State Physics RAS, State Scientific Institution “Institute for Single Crystals” of National Academy of Sciences of Ukraine, University of California, Los Angeles

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funders: U.S. Department of Energy, Sandia National Laboratories

OpenAlex ID: W2008603859

FWCI: 0.428

Cites: 11

Cited by: 10

Related to: 10