Work

Multiple scattering and the 200 reflection in silicon and germanium

Year: 1988

Type: article

Source: Acta Crystallographica Section A Foundations of Crystallography

DOI: 10.1107/s0108767387008006

Authors: J. Z. Tischler, J. D. Budai, G. E. Ice, A. Habenschuss

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2008922366

FWCI: 0.435

Cites:

Cited by: 28

Related to: 10