Work

Automatic Inspection System for Cmos Camera Defect

Year: 2005

Type: conference-paper

Source: IFAC Proceedings Volumes

DOI: 10.3182/20050703-6-cz-1902.01189

Authors: Byoung-Wook Choi, Kuk Won Ko, Kyoung-Chul Koh, Bok Shin Ahn

Institutions: Seoul National University of Science and Technology, Sun Moon University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2009840657

FWCI:

Cites: 7

Cited by: 2

Related to: 10