Work

Growth and characterization of Yb3+ doped Y2SiO5 layers on Y2SiO5 substrate for laser applications

Year: 2007

Type: article

Source: Optical Materials

DOI: 10.1016/j.optmat.2007.06.013

Authors: F. Thibault, D. Pelenc, B. Chambaz, M. Couchaud, J. Petit, B. Viana

Institutions: Commissariat à l'Énergie Atomique et aux Énergies Alternatives, CEA Grenoble, Laboratoire d'Électronique des Technologies de l'Information, Chimie ParisTech - PSL

Language: English

Topic: Solid State Laser Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2010032183

FWCI: 0.306

Cites: 16

Cited by: 10

Related to: 10