Effect of Low Level O2 Addition to N2 on Surface Cleaning by Nonequilibrium Atmospheric-Pressure Pulsed Remote Plasma
Year: 2007
Type: article
Abstract: The effect of O 2 additions below 0.2% to N 2 was investigated for the cleaning of organic contaminants on an indium tin oxide film using a nonequilibrium atmospheric-pressure pulsed plasma. A remarkably high cleaning efficiency was obtained for plasma treatment with additions from 0.025 to 0.1% O 2 to N 2 . The concentration of the ground state oxygen radical [O( 3 P)] was measured using vacuum UV laser absorption spectroscopy. It was found that the key factor for the surface cleaning was the scission of carbon bonds due to UV emissions, and subsequent oxidation due to O( 3 P) and ozone.
DOI: 10.1143/jjap.46.l540
Institutions: Nagoya University, Wakayama University, Sekisui Chemical (Japan)
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2010109730
