Work

The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy

Year: 2004

Type: article

Source: Journal of Electroceramics

DOI: 10.1007/s10832-004-5114-y

Authors: Bryan D. Huey, Chandra Ramanujan, Musuvathi Bobji, John Blendell, Grady White, Robert Szoszkiewicz, Andrzej Kulik

Institutions: National Institute of Standards and Technology, University of Oxford, École Polytechnique Fédérale de Lausanne

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2010370282

FWCI: 1.708

Cites: 7

Cited by: 56

Related to: 10