Electrical property of coincidence site lattice grain boundary in location-controlled Si island by excimer-laser crystallization
Year: 2005
Type: article
Source: Thin Solid Films
Authors: R. Ishihara, M. He, V. Rana, Y. Hiroshima, S. Inoue, T. Shimoda, J.W. Metselaar, C.I.M. Beenakker
Institutions: Delft University of Technology, Seiko Holdings (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2010548301