Work

Interface characterization of B 4 C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering

Year: 2013

Type: article

Abstract: B4C-based multilayers have important applications for soft to hard X-rays. In this paper, X-ray grazing-incidence reflectivity and diffuse scattering, combining various analysis methods, were used to characterize the structure of B4C-based multilayers including layer thickness, density, interfacial roughness, interdiffusion, correlation length, etc. Quantitative results for W/B4C, Mo/B4C and La/B4C multilayers were compared. W/B4C multilayers show the sharpest interfaces and most stable structures. The roughness replications of La/B4C and Mo/B4C multilayers are not strong, and oxidations and structure expansions are found in the aging process. This work provides guidance for future fabrication and characterization of B4C-based multilayers.

Source: Journal of Synchrotron Radiation

DOI: 10.1107/s0909049513004329

Authors: Hui Jiang, Zhanshan Wang, Jingtao Zhu

Institutions: Chinese Academy of Sciences, Shanghai Institute of Applied Physics, Shanghai Synchrotron Radiation Facility, Tongji University

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2010560087

FWCI: 0.887

Cites: 16

Cited by: 13

Related to: 10