Work

A time-of-flight atom-probe field-ion microscope for the study of defects in metals

Year: 1976

Type: article

Source: Scripta Metallurgica

DOI: 10.1016/0036-9748(76)90178-2

Authors: Thomas M. Hall, Alfred Wagner, Arnold S. Berger, David N. Seidman

Institutions: Cornell University, Argonne National Laboratory

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: General Materials Science

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2010634374

FWCI: 10.39

Cites: 13

Cited by: 22

Related to: 10