Work

Modeling of a Bubble-Memory Organization with Self-Checking Translators to Achieve High Reliability

Year: 1973

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/t-c.1973.223706

Authors: W.G. Bouricius, W.C. Carter, E.P. Hsieh, D.C. Jessep, A.B. Wadia

Institutions: IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2011233763

FWCI: 1.999

Cites: 6

Cited by: 6

Related to: 10