Improving Quality, Reliability and Profitability of Mobility Electronics Using Systemic Failure Mode Analysis
Year: 2014
Type: article
DOI: 10.4271/2014-01-0229
Author: David E. Verbitsky
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2011305132
