Work

Pixelated phase-mask dynamic interferometer

Year: 2004

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.560807

Authors: James E. Millerd, Neal J. Brock, John B. Hayes, Michael B. North-Morris, Matt Novak, James C. Wyant

Institution: 4D Technology (United States)

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2011662635

FWCI: 6.562

Cites: 15

Cited by: 358

Related to: 10