Work

Characterization of a 32×32 InSb hybrid IR focal plane

Year: 1978

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.1978.189467

Authors: W.J. Parrish, F.J. Renda, N.L. Ray, D.G. Maeding, R.E. Eck, J.R. Toman

Institution: Hughes Aircraft (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2011983172

FWCI:

Cites: 1

Cited by: 1

Related to: 10