Work

Monitoring fatigue damage growth in polysilicon microstructures under different loading conditions

Year: 2010

Type: article

Source: Sensors and Actuators A Physical

DOI: 10.1016/j.sna.2010.03.011

Authors: Giacomo Langfelder, Antonio Longoni, Federico Zaraga

Institution: Politecnico di Milano

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2011999869

FWCI: 2.206

Cites: 21

Cited by: 18

Related to: 10