Work

Plasma emission monitoring (PEM) controlled DC reactive sputtered ZnO:Al thin films

Year: 2012

Type: article

Source: Vacuum

DOI: 10.1016/j.vacuum.2012.03.052

Authors: P.D. Nsimama, G.A. Niklasson, M.E. Samiji, G.W. Mbise, J. Wennerberg

Institutions: Dar es Salaam Institute of Technology, Uppsala University, University of Dar es Salaam

Language: English

Topic: ZnO doping and properties

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2012106446

FWCI: 0.13

Cites: 20

Cited by: 3

Related to: 10