Work

Fast reliability qualification of SiP products

Year: 2009

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2009.07.042

Authors: Charles Regard, Christian Gautier, Hélène Fremont, Patrick Poirier, M.A. Xiaosong, Kaspar M.B. Jansen

Institutions: Laboratoire de l'Intégration du Matériau au Système, Université Bordeaux-I, Université de Caen Normandie, Delft University of Technology

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2012133109

FWCI: 1.289

Cites: 8

Cited by: 9

Related to: 10