High-resolution spectroscopy using an echelle spectrometer with predisperser—I. Characteristics of the instrument and approach for measuring physical line widths in an inductively coupled plasma
Year: 1984
Type: article
Authors: P.W.J.M. Boumans, J.J.A.M. Vrakking
Institution: Philips (Netherlands)
Language: English
Subfield: Spectroscopy
Field: Chemistry
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2012392844
