9.3: Control of Threshold Voltage in Back Channel Etch Type Amorphous Indium Gallium Zinc Oxide Thin Film Transistors
Year: 2011
Type: conference-paper
DOI: 10.1889/1.3621002
Authors: Seung Min Lee, Chang Il Ryoo, Jae Wook Park, Joonsoo Han, Dae‐Won Kim, Yong‐Yub Kim, Im‐Kuk Kang, Kyung‐Han Seo, Young Ju Koh, Dong‐Min Han, Yong‐Ho Choi, Hyun‐Sik Seo, Bong Chul Kim, Soo Youle Cha, Jong‐Uk Bae, Chang Dong Kim, Myungchul Jun, Yong Kee Hwang
Institution: LG (South Korea)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2012803762