Work

Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory

Year: 2002

Type: article

Source: Applied Optics

DOI: 10.1364/ao.41.004876

Authors: Akira Hirabayashi, Hidemitsu Ogawa, Katsuichi Kitagawa

Institutions: Tokyo Institute of Technology, Yamaguchi University, Toray Engineering Co., Ltd. (Japan)

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2012934872

FWCI: 1.303

Cites: 15

Cited by: 68

Related to: 10