Shot noise in x-ray measurements with p-i-n diodes
Year: 2005
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.1947776
Author: Jonathan D. Spear
Institutions: Lawrence Berkeley National Laboratory, Advanced Light Source
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2013017678