MTTF and availability evaluation of a two-unit, two-state, parallel redundant complex system with constant human failure
Year: 1986
Type: article
Source: Microelectronics Reliability
Authors: P.P. Gupta, Arvind Kumar
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2013018275
