Work

The Transistor Characteristics of Zinc Oxide Active Layer with Different Thickness of Zinc Oxide Thin-Film

Year: 2012

Type: conference-paper

Source: International Symposium on Computer, Consumer and Control

DOI: 10.1109/is3c.2012.220

Authors: Hsin-Chiang You, Yen-Wei Tu, Yu-Hsien Lin, Shao-Hui Shieh

Institutions: National Chin-Yi University of Technology, National United University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Council

OpenAlex ID: W2013246292

FWCI: 0.406

Cites: 10

Cited by: 2

Related to: 10