Fault diagnosis of double circuit lines on the same tower based on six-sequence component and expert system
Year: 2012
Type: conference-paper
DOI: 10.1049/cp.2012.0118
Authors: Tao Zhang, Qing Chen, Zhanjun Gao, Debin Huang, Yi Tang
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2013288226
