Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
Year: 2002
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1508427
Authors: Y. Wu, Y. Ishimaru, H. Wakana, S. Adachi, Y. Tarutani, K. Tanabe
Institution: International Superconductivity Technology Center
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2013569067