Work

Simulation of a multilayer X-ray mirror with fluctuation and systematic deviation of periods

Year: 1991

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment

DOI: 10.1016/0168-9002(91)90672-d

Authors: X.Y. Yuan, C. Gao, S.P. Guo, X.C. He, Z.Q. Wu

Institution: University of Science and Technology of China

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, University of Science and Technology of China

OpenAlex ID: W2013608142

FWCI: 0.375

Cites: 4

Cited by: 1

Related to: 10