Characterizing nanometer-sized V-defects in InGaN single quantum well films by high-spatial-resolution cathodoluminescence spectroscopy
Year: 2009
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.3104850
Authors: M. Yoshikawa, M. Murakami, H. Ishida, H. Harima
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2013802034