Work

Use of Monte Carlo Methods in Characterizing Nanostructured Materials by Wide‐ and Small‐Angle X‐Ray Scattering

Year: 2005

Type: article

Source: Journal of Dispersion Science and Technology

DOI: 10.1081/dis-200025735

Authors: Paolo Emilio Di Nunzio, Stefano Martelli, Roberto Ricci Bitti

Institution: RINA Consulting - Centro Sviluppo Materiali S.p.A. (Italy)

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2014534576

FWCI:

Cites: 15

Cited by: 8

Related to: 10