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Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect

Year: 2010

Type: article

Source: Electrochemical and Solid-State Letters

DOI: 10.1149/1.3290686

Authors: Fu-Yen Jian, Ting-Chang Chang, An-Kuo Chu, Te-Chih Chen, Shih-Ching Chen, Chia-Sheng Lin, Hung-Wei Li, Ming-Hsien Lee, Jim-Shone Chen, Ching-Chieh Shih

Institutions: National Sun Yat-sen University, National Yang Ming Chiao Tung University, AU Optronics (Taiwan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Sun Yat-sen University, National Science Council, AU Optronics

OpenAlex ID: W2014765236

FWCI:

Cites: 8

Cited by: 1

Related to: 10