Work

Transient current mapping obtained from silicon photodiodes using focused ion microbeams with several hundreds of MeV

Year: 2009

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/j.nimb.2009.03.051

Authors: T. Hirao, S. Onoda, M. Oikawa, T. Satoh, T. Kamiya, T. Ohshima

Institutions: Japan Atomic Energy Agency, Gunma University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funder: Japan Atomic Energy Agency

OpenAlex ID: W2015185274

FWCI: 2.062

Cites: 11

Cited by: 16

Related to: 10