Work

Electrical switching of molecular thin films filled in metal oxide cracks

Year: 2012

Type: article

Source: Applied Physics A

DOI: 10.1007/s00339-012-7284-9

Authors: J. C. Li, X. Gong, D. Wang, D. C. Ba

Institutions: Northeastern University, Northeastern University

Language: English

Topic: Molecular Junctions and Nanostructures

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2015274684

FWCI: 0.6

Cites: 60

Cited by: 5

Related to: 10