Work

Transmission Electron Diffraction Pattern of Electron-Irradiation-Induced {113}-Faulted Loops in Si

Year: 1990

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.1143/jjap.29.l1698

Authors: Seiji Takeda, Shunsuke Muto, Mitsuji Hirata

Institution: The University of Osaka

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2015287045

FWCI: 1.082

Cites: 6

Cited by: 13

Related to: 10