Work

Stress Analysis Combining Speckle Metrology With Finite Element Modelling

Year: 1985

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.949530

Authors: D. R. Matthys, T. D. Dudderar, J. A. Gilbert, M. A. Taher, H. S. Johnson

Institutions: Marquette University, AT&T (United States), University of Wisconsin–Milwaukee

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2015519926

FWCI: 1.559

Cites:

Cited by: 1

Related to: 10