Influence of Membrane Thickness on Membrane Degradation and Platinum Agglomeration under Long-term Open Circuit Voltage Conditions
Year: 2014
Type: article
Source: Electrochimica Acta
Authors: Ming Zhao, Weiyu Shi, Bingbing Wu, Wenming Liu, Jianguo Liu, Danmin Xing, Yingfang Yao, Zhongjun Hou, Pingwen Ming, Zhigang Zou
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2015715348
