Work

Determination of the composition and thickness of semi-polar and non-polar III-nitride films and quantum wells using X-ray scattering

Year: 2012

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/1.3678631

Authors: M. E. Vickers, J. L. Hollander, C. McAleese, M. J. Kappers, M. A. Moram, C. J. Humphreys

Institution: University of Cambridge

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Winston Churchill Foundation of the United States, Gates Cambridge Trust, Engineering and Physical Sciences Research Council

Awards: Science Bridge Award USA: Harnessing Materials for Energy, Nitrides for the 21st century, Lighting the Future

OpenAlex ID: W2016320265

FWCI: 1.13

Cites: 34

Cited by: 16

Related to: 10