Work

An alternative method for measuring flatband voltage in MOS devices

Year: 1999

Type: article

Source: Microelectronic Engineering

DOI: 10.1016/s0167-9317(99)00255-5

Authors: A Benfdila, A Chikouche

Institutions: Mouloud Mammeri University of Tizi-Ouzou, Centre de Développement des Technologies Avancées

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2016354690

FWCI: 0.444

Cites: 5

Cited by: 2

Related to: 10