Work

Improved voltage margins using linear error-correcting codes in resistor-logic demultiplexers for nanoelectronics

Year: 2005

Type: article

Source: Nanotechnology

DOI: 10.1088/0957-4484/16/9/001

Authors: Philip J Kuekes, Warren Robinett, R Stanley Williams

Institution: Hewlett-Packard (United States)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Defense Advanced Research Projects Agency

OpenAlex ID: W2016379652

FWCI: 4.617

Cites: 20

Cited by: 30

Related to: 10